<?xml version="1.0" encoding="utf-8" standalone="yes"?><rss version="2.0" xmlns:atom="http://www.w3.org/2005/Atom"><channel><title>Computer Vision on Ye Joo Park's Blog</title><link>https://park.is/categories/computer-vision/</link><description>Recent content in Computer Vision on Ye Joo Park's Blog</description><generator>Hugo</generator><language>en-US</language><lastBuildDate>Fri, 06 Apr 2018 00:00:00 +0000</lastBuildDate><atom:link href="https://park.is/categories/computer-vision/index.xml" rel="self" type="application/rss+xml"/><item><title>Detecting Local Image Features with SIFT</title><link>https://park.is/blog_posts/20180406_sift/</link><pubDate>Fri, 06 Apr 2018 00:00:00 +0000</pubDate><guid>https://park.is/blog_posts/20180406_sift/</guid><description>&lt;p&gt;SIFT (Scale-Invariant Feature Transform) is a computer vision algorithm for detecting and describing local features in images. Developed by David Lowe in 1999, SIFT has become a fundamental tool for various applications due to its robustness and versatility.&lt;/p&gt;&#10;&lt;h2 id="use-cases-of-sift"&gt;Use Cases of SIFT&lt;/h2&gt;&#10;&lt;h3 id="-object-recognition"&gt;👀 Object Recognition&lt;/h3&gt;&#10;&lt;p&gt;SIFT is widely used for detecting and identifying specific objects within complex scenes. Its ability to extract distinctive features that are invariant to scale, rotation, and illumination changes makes it effective for recognizing objects across different viewpoints and conditions.&lt;/p&gt;</description></item></channel></rss>